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S.M.A.R.T. attribute 178 is same as 179 

smartctl --all /dev/sda
178 Used_Rsvd_Blk_Cnt_Chip  0x0013   100   100   010    Pre-fail  Always

Differential Revision: https://phabricator.kde.org/D17683
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Anthony Fieroni 2018-12-19 23:18:49 +00:00 committed by Andrius Štikonas
parent 8d980b56ed
commit faca8f7f0d
1 changed files with 1 additions and 0 deletions
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src/core/smartattribute.cpp
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@ -128,6 +128,7 @@ static const AttrDetails* attrDetails()
{ 175, i18nc("SMART attr name", "SSD Power Loss Protection Failure"), i18nc("SMART attr description", "Last test result, saturated at its maximum value. Bytes 0-1: last test result as microseconds to discharge cap in range [25, 5000000], lower indicates specific error code. Bytes 2-3: minutes since last test. Bytes 4-5: lifetime number of tests. Normalized value is set to 1 on test failure or 11 if the capacitor has been tested in an excessive temperature condition, otherwise 100.") },
{ 176, i18nc("SMART attr name", "SSD Erase Fail Count (chip)"), i18nc("SMART attr description", "Number of flash erase command failures.") },
{ 177, i18nc("SMART attr name", "SSD Wear Range Delta"), i18nc("SMART attr description", "Delta between most-worn and least-worn flash blocks.") },
{ 178, i18nc("SMART attr name", "SSD Used Reserved Block Count Total"), i18nc("SMART attr description", "\"Pre-Fail\" Samsung attribute.") },
{ 179, i18nc("SMART attr name", "SSD Used Reserved Block Count Total"), i18nc("SMART attr description", "\"Pre-Fail\" Samsung attribute.") },
{ 180, i18nc("SMART attr name", "SSD Unused Reserved Block Count Total"), i18nc("SMART attr description", "\"Pre-Fail\" HP attribute.") },
{ 181, i18nc("SMART attr name", "SSD Program Fail Count Total or Non-4K Aligned Access Count"), i18nc("SMART attr description", "Number of flash program operation failures since the drive was deployed.") },