From faca8f7f0d5494ea1346bd10a7cb0aef43ed67da Mon Sep 17 00:00:00 2001 From: Anthony Fieroni Date: Wed, 19 Dec 2018 23:18:49 +0000 Subject: [PATCH] S.M.A.R.T. attribute 178 is same as 179 smartctl --all /dev/sda 178 Used_Rsvd_Blk_Cnt_Chip 0x0013 100 100 010 Pre-fail Always Differential Revision: https://phabricator.kde.org/D17683 --- src/core/smartattribute.cpp | 1 + 1 file changed, 1 insertion(+) diff --git a/src/core/smartattribute.cpp b/src/core/smartattribute.cpp index f27bb07..fc0e9a5 100644 --- a/src/core/smartattribute.cpp +++ b/src/core/smartattribute.cpp @@ -128,6 +128,7 @@ static const AttrDetails* attrDetails() { 175, i18nc("SMART attr name", "SSD Power Loss Protection Failure"), i18nc("SMART attr description", "Last test result, saturated at its maximum value. Bytes 0-1: last test result as microseconds to discharge cap in range [25, 5000000], lower indicates specific error code. Bytes 2-3: minutes since last test. Bytes 4-5: lifetime number of tests. Normalized value is set to 1 on test failure or 11 if the capacitor has been tested in an excessive temperature condition, otherwise 100.") }, { 176, i18nc("SMART attr name", "SSD Erase Fail Count (chip)"), i18nc("SMART attr description", "Number of flash erase command failures.") }, { 177, i18nc("SMART attr name", "SSD Wear Range Delta"), i18nc("SMART attr description", "Delta between most-worn and least-worn flash blocks.") }, + { 178, i18nc("SMART attr name", "SSD Used Reserved Block Count Total"), i18nc("SMART attr description", "\"Pre-Fail\" Samsung attribute.") }, { 179, i18nc("SMART attr name", "SSD Used Reserved Block Count Total"), i18nc("SMART attr description", "\"Pre-Fail\" Samsung attribute.") }, { 180, i18nc("SMART attr name", "SSD Unused Reserved Block Count Total"), i18nc("SMART attr description", "\"Pre-Fail\" HP attribute.") }, { 181, i18nc("SMART attr name", "SSD Program Fail Count Total or Non-4K Aligned Access Count"), i18nc("SMART attr description", "Number of flash program operation failures since the drive was deployed.") },